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Certain Probe Card Assemblies and Certain Tested DRAM and NAND Flash Memory Devices

FormFactor, Inc.

Phicom Corporation

Defended Phicom Corp. against charges of patent infringement on its semiconductor probe card assemblies. The Commission found no violation of Section 337.

Certain Probe Card Assemblies and Certain Tested DRAM and NAND Flash Memory Devices, 337-TA-621, ITC, Judges Bullock, Essex

Related Professionals

Anand K. Sharma
Partner
Washington, DC
+1 202 408 4446
Email
Michael E. Kudravetz
Litigation Counsel
Boston, MA
+1 617 646 1663
Email

Related Practices

Global IP Enforcement, Litigation, and Trials

ITC Section 337 Investigations and Trials

Related Industries

Electronic Devices and Components

Related Experiences

Certain EPROMs, EEPROM, Flash Memory, and Flash Microcontroller Semiconductor Devices

Winbond Electronics Corp.

Certain Dynamic Random Access Memory Semiconductors 

Elpida Memory, Inc. et. al.

Certain Portable Electronic Communications Devices, including Mobile Phones

HTC Corp.

Certain Surgical Stapler Devices and Components Thereof

Covidien LP

Certain Electronic Devices with Image Processing Systems

S3 Graphics Co., Ltd.

Certain Electronic Devices with Graphics Data Processing Systems

S3 Graphics Co., Ltd.

Certain Portable Electronic Devices

HTC Corp.

Certain Computing Devices with Associated Instruction Sets and Software

VIA Technologies, Inc.; Centaur Technology, Inc.

Certain Electronic Devices with Communication Capabilities, Components Thereof, and Related Software

HTC Corp.

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